Spectroscopic ellipsometer is widely used for thin film and measurements. It uses a high speed CCD array detection to collect the entire spectrum. It measures films from nanometer thickness up to tens of microns and the optical properties from transparent to absorbing materials. It accurately measures optical constants like refractive index, film thickness and extinction coefficient.
Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers:-
- Discrete Wavelength Ellipsometers (Single Wavelength Ellipsometers and Multi-wavelength Ellipsometers)
- Spectroscopic Ellipsometers Deep UV, UV, VIS, NIR and IR.
We offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Many upgradable accessories are available for different applications:-
|
